Method and apparatus for controlling a machine based on a detection of an abnormality
AssigneeMeiwa E-Tec Co., Ltd.
InventorsHiroomi YAMADA, Hirokazu KIDA, Sakayuki ISHIKAWA
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AssigneeMeiwa E-Tec Co., Ltd.
InventorsHiroomi YAMADA, Hirokazu KIDA, Sakayuki ISHIKAWA
Estimating the term…
An abnormality monitoring method capable of reliably detecting abnormality or an initiation of an abnormality of a monitored object includes: acquiring time series monitored data from a monitored object; calculating a wavelet transformed image from the monitored data; calculating a feature value at each point in the wavelet transformed image; and determining a presence or an absence of an abnormality of the monitored object based on the feature value. The feature value is a moment from a predetermined origin on a wavelet transformed image, and the presence or the absence of the abnormality of the monitored object is determined based on a Mahalanobis' Distance calculated from the feature value.
A method, comprising:
An apparatus, comprising:
A method comprising:
Dependencies are inferred from the claim text.