Techniques for forming vertical transport fet
AssigneeInternational Business Machines Corporation
InventorsChoonghyun Lee, Kangguo Cheng, Juntao Li
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AssigneeInternational Business Machines Corporation
InventorsChoonghyun Lee, Kangguo Cheng, Juntao Li
Estimating the term…
Techniques for reducing work function metal variability along the channel of VFET devices are provided. In one aspect, a method of forming a VTFET device includes: patterning fins in a wafer; forming bottom source/drains at a base of the fins and bottom spacers on the bottom source/drains; forming gate stacks over the fins including a gate conductor having a combination of work function metals including an outer layer and at least one inner layer of the work function metals; isotropically etching the work function metals which recesses the gate stacks with an outwardly downward sloping profile; isotropically etching the at least one inner layer while covering the outer layer of the work function metals to eliminate the outwardly downward sloping profile of the gate stacks; forming top spacers above the gate stacks; and forming top source and drains at tops of the fins. A VTFET device is also provided.
A method of forming a vertical transport field-effect transistor (VTFET) device, the method comprising the steps of:
A VTFET device, comprising:
Dependencies are inferred from the claim text.