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US 2020/0027704 A1Published application
Non-pertubative measurements of low and null magnetic field in high temperature plasmas
AssigneeTae Technologies, Inc.
InventorsDeepak K. Gupta, Richard Ignace, Kenneth H. Nordsieck
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Abstract
Systems and methods that facilitate non-pertubative measurements of low and null magnetic field in high temperature plasmas.
Claims20
A non-perturbative method of measuring magnetic fields in high-temperature plasmas, comprising:
- radially injecting a first plurality of laser beams into an FRC plasma, wherein each of the laser beams has a different polarization,
- intersecting a null location in a FRC magnetic field of the FRC plasma at two locations;
- imaging paths of the first plurality of laser beams in a vertical direction of a CCD;
- splitting light in the vertical direction is further split in orthogonal polarizations using a birefringent crystal;
- and
- measuring the null location of the FRC magnetic field.
3 more elements
A non-perturbative method of measuring magnetic fields in high-temperature plasmas, comprising:
- imaging a wavelength of an FRC plasma along a horizontal axis direction of a CCD;
- imaging a radial extent of the FRC plasma along a vertical axis direction of the CCD;
- splitting light in the vertical direction into orthogonal polarizations using a birefringent crystal;
- and
- measuring a null location of an FRC magnetic field of the FRC plasma.
2 more elements
A spectro-polarimeter for non-perturbative measuring of magnetic fields in high-temperature plasmas, comprising:
- a spectrometer;
- a fast imaging CCD camera;
- three laser beams;
- and
- a birefringent crystal.
2 more elements
(canceled)
Dependencies are inferred from the claim text.