Transmission electron microscope specimen and method of manufacturing the same
AssigneeNational Chiao Tung University
InventorsWen-Wei WU, Wei-Huan TSAI, Jui-Yuan CHEN, Cheng-Lun HSIN
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AssigneeNational Chiao Tung University
InventorsWen-Wei WU, Wei-Huan TSAI, Jui-Yuan CHEN, Cheng-Lun HSIN
Estimating the term…
An electron microscope specimen includes a first electron-transport layer, a second electron-transport layer, a spacer layer, and a carrier layer. The second electron-transport layer has a first opening, a second opening, and a viewing area, wherein the viewing area is between the first opening and the second opening. The spacer layer is sandwiched between the first electron-transport layer and the second electron-transport layer, and the spacer layer has an accommodating space communicating with the first opening and the second opening. The carrier layer is disposed on the second electron-transport layer, and has a viewing window, a first injection hole, and a second injection hole, wherein the viewing window is substantially aligned with the viewing area and the accommodating space, and the first injection hole and the second injection hole respectively communicate with the first opening and the second opening.
A transmission electron microscope specimen, comprising:
A method of manufacturing a transmission electron microscope specimen, comprising:
Dependencies are inferred from the claim text.