Protocol independent testing of memory devices using a loopback
AssigneeMicron Technology, Inc.
InventorsPatrick Caraher, Michael B. Danielson
Life of this patent
Estimating the term…
Abstract
A device under test for performing built-in self-tests to determine the functionality of one or more components of the device under test is described. The device under test includes a storage location to store a set of tests for testing the device under test; a data generator to generate a test pattern based on a test in the set of tests; a transmission unit to transmit the test pattern to a test system; a receiver unit to receive a set of loopback signals from the test system, wherein the set of loopback signals represent the test pattern; and a data checker to determine success or failure of the device under test based on the set of loopback signals.
Claims20
A device under test for performing built-in self-tests to determine the functionality of one or more components of the device under test, the device under test comprising:
- a storage location to store a set of tests for testing the device under test;
- a data generator to generate a test pattern based on a test in the set of tests;
- a transmission unit to transmit the test pattern to a test system;
- a receiver unit to receive a set of loopback signals from the test system, wherein the set of loopback signals represent the test pattern;
- and
- a data checker to determine success or failure of the device under test based on the set of loopback signals.
A test system to determine the functionality of a device under test, the test system comprising:
- a receiver unit to receive data from the device under test;
- a transmission unit to transmit data to the device under test;
- and
- a loopback coupling the receiver unit to the transmission unit, wherein the loopback is enabled to pass a set of loopback signals, which are based on a set of test signals received from the device under test and represent a test pattern for testing a component of the device under test, from the receiver unit to the transmission unit such that the set of loopback signals are passed to the device under test via the transmission unit.
A method to determine the functionality of a device under test, the method comprising:
- enabling a loopback in a test system;
- transmitting a set of test signals to the test system, wherein the set of test signals represent a test pattern of a test for testing a component of the device under test;
- receiving a set of loopback signals, based on the set of test signals and representing the test pattern for testing the component of the device under test, via the loopback that couples a receiver unit and a transmission unit of the device under test;
- and
- determining whether the device under test passes the test based on the set of loopback signals.
Dependencies are inferred from the claim text.