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US 2020/0027496 A1Published application
Semiconductor device
AssigneeSK hynix Inc.
InventorJung Hwan LEE
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AssigneeSK hynix Inc.
InventorJung Hwan LEE
Estimating the term…
A semiconductor device includes a soft repair control circuit configured to generate an enable signal, in response to a soft repair control signal, wherein the enable signal is enabled when first and second internal addresses counted in a refresh operation have the same combination as first and second failure addresses, and the semiconductor device also includes a core circuit including first, second, third, and fourth regions each including a plurality of word lines which are activated based on a combination of the first, the second, third, and fourth internal addresses, wherein the core circuit is configured to repair, in response to the enable signal, a word line in which a failure has occurred and which is included in a region selected among the first, second, third, and fourth regions by the third and fourth internal addresses.
A semiconductor device comprising:
A semiconductor device comprising first, second, third, and fourth regions which each include a plurality of word lines and a plurality of redundancy word lines, wherein at least one of the first, second, third, and fourth regions are selectively activated depending on first, second, third, and fourth internal addresses in a refresh operation in response to an enable signal, and wherein a word line in which a failure has occurred and which is included in a region activated among the first, second, third, and fourth regions depending on the first, second, third, and fourth internal addresses is repaired.
Dependencies are inferred from the claim text.