Biased sampling methodology for wear leveling
AssigneeMicron Technology, Inc.
InventorsYing Yu Tai, Jiangli Zhu
Life of this patent
Estimating the term…
Abstract
First data units can be sampled from a set of data units of a memory component. The first data units can be a subset of the set of data units. An initial data unit is determined from the first data units as a first candidate data unit based on a wear metric associated with the first data units. The wear metric is indicative of a level of physical wear of the first data units. A wear leveling operation can be performed in view of the first candidate data unit.
Claims20
A system comprising:
- memory device;
- and
- a processing device, coupled to the memory device, the processing device to:
- sample first data units from a set of data units of the memory device, wherein the first data units comprise a subset of the set of data units;
- sort the first data units that were sampled from the set of data units into a first order based on a wear metric associated with the first data units, wherein the wear metric is indicative of a level of physical wear of the first data units;
- responsive to sorting the first data units, determine an initial data unit from the first data units as a first candidate data unit based on the wear metric associated with the first data units;
- and
- perform a wear leveling operation in view of the first candidate data unit.
(canceled)
A method, comprising:
- sampling, by a processing device, first data units from a set of data units of a memory device, wherein the first data units comprise a subset of the set of data units;
- sorting the first data units that were sampled from the set of data units into a first order based on a wear metric associated with the first data units, wherein the wear metric is indicative of a level of physical wear of the first data units;
- responsive to sorting the first data units, determining an initial data unit from the first data units based on the wear metric associated with the first data units, wherein the wear metric is indicative of a level of physical wear of the first data units;
- and
- perform a wear leveling operation in view of the first candidate data unit.
A non-transitory computer-readable medium comprising instructions that, responsive to execution by a processing device, cause the processing device to perform operations comprising:
- sampling, by the processing device, first data units from a set of data units of a memory device using a biased sampling process that increases a probability of sampling particular data units of the set of data units with a higher wear metric, wherein a wear metric is indicative of a level of physical wear of the first data units;
- sorting the first data units that were sampled from the set of data units in a first order based on the wear metric associated with the first data units;
- and
- responsive to sorting the first data units in the first order, selecting an initial data unit from the first order of the first data units as a first candidate data unit on which to perform a wear leveling operation.
Dependencies are inferred from the claim text.