Computer system power monitoring

A method, comprising:

• performing wafer-level testing on a particular integrated circuit that includes a voltage regulator circuit to generate wafer-level test data;
• setting one or more operation parameters of the voltage regulator circuit based on the wafer-level test data;
• mounting the particular integrated circuit with another integrated circuit on a common substrate;
• sampling one or more operation characteristics of the voltage regulator circuit by a measurement circuit after the particular integrated circuit has been mounted on the common substrate with the other integrated circuit;
• and
• adapting, by a control circuit included in the particular integrated circuit, operation of the voltage regulator circuit based on results of sampling the one operation characteristics.

A non-transitory computer-readable storage medium having design information stored thereon, wherein the design information specifies a design of at least a portion of a hardware integrated circuit in a format recognized by a semiconductor fabrication system that is configured to use the design information to produce the hardware integrated circuit according to the design information, wherein the design information specifies that the hardware integrated circuit comprises:

• a voltage regulator circuit configured to generate a voltage level on a power supply signal of a computer system using a source power supply signal and based on initial values of one or more operation parameters derived from wafer-level test data;
• a measurement circuit configured to sample one or more operation characteristics of the voltage regulator circuit at a plurality of time points to generate measurement data;
• and
• a control circuit configured to adapt operation of the voltage regulator circuit based on the measurement data.