Far-field optical super-resolution microscopy method

A far-field optical super-resolution microscopy method, the method comprising the steps of:

• S1, placing a sample on a displacement scanning translation stage, and finding, via a microscopy imaging system, an area in which a sample to be measured is located, wherein a transmission imaging system is adopted to image a comparatively transparent sample, and a reflection imaging system is adopted to image a non-transparent sample;
• S2, inputting, via a signal amplifier, a signal of a network analyzer with the frequency f into an acousto-optic modulator to modulate the intensity of an excitation laser, wherein the intensity of the excitation laser changes at the same frequency;
• S3, after the excitation laser is beam-expanded by a first lens L1 and a second lens L2, focusing the excitation laser by an objective on the sample as an excitation light source for vibrating the sample;
• S4, measuring at a far field a resonance frequency, an amplitude and a phase of a micro-structure on the surface of the sample via a laser interference vibrometer;
• S5, performing nano-precision point-by-point scanning on the surface of the sample to be measured by the displacement scanning translation stage, and for each scanned point, obtaining a vibration frequency response of the micro-structure at the position via the network analyzer, wherein the vibration frequency response comprises an amplitude characteristic and a phase characteristic;
• and
• S6, rendering a high-resolution spatial position, an excitation frequency vibration spectrum, and an image pattern by the displacement scanning translation stage.