Integrated Circuit Interconnect Structures with Air Gaps
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTai-I Yang, Li-Lin Su, Yung-Hsu Wu, Hsin-Ping Chen, Cheng-Chi Chuang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsTai-I Yang, Li-Lin Su, Yung-Hsu Wu, Hsin-Ping Chen, Cheng-Chi Chuang
Estimating the term…
Examples of an integrated circuit with an interconnect structure and a method for forming the integrated circuit are provided herein. In some examples, the method includes receiving a workpiece having an interconnect structure that includes a first conductive feature, a second conductive feature disposed beside the first conductive feature, and an inter-level dielectric disposed between the first conductive feature and the second conductive feature. A conductive material of an etch stop layer is selectively deposited on the first conductive feature and on the second conductive feature without depositing the conductive material on the inter-level dielectric, and the inter-level dielectric is removed to form a gap between the first conductive feature and the second conductive feature.
A method of forming an integrated circuit device comprising:
A method comprising:
A device comprising:
Dependencies are inferred from the claim text.