Defect inspection system and method using artificil intelligence
AssigneeUtechzone Co., Ltd.
InventorsARULMURUGAN AMBIKAPATHI, Ming-Tang Hsu, Chia-Liang Lu, Chih-Heng Fang
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AssigneeUtechzone Co., Ltd.
InventorsARULMURUGAN AMBIKAPATHI, Ming-Tang Hsu, Chia-Liang Lu, Chih-Heng Fang
Estimating the term…
A defect inspection system, connected to an automatic visual inspection device, is provided, including the followings. A re-inspection server (VRS) receives a defect image and a defect location. A training terminal stores trained modules. A classification terminal receives the defect image and the defect location, reads a target trained module corresponding to the defect image, classifies the defect image according to the target trained module to obtain a labeled defect image, and sends the labeled defect image to the VRS. A re-inspection terminal receives the labeled defect image from the VRS, and sends a verified operation corresponding to the labeled defect image to the VRS. A labeling re-inspection terminal receives the verified operation and the labeled defect image, and a labeling result corresponding to the labeled defect image. The VRS sends the labeling result and the labeled defect image to the training terminal to train a corresponding training module.
A defect inspection system using artificial intelligence and connected to an automatic visual inspection device, the defect inspection system comprising:
A defect inspection method using artificial intelligence for a defect inspection system connected to an automatic visual inspection device, wherein the defect inspection system comprises a re-inspection server, a training terminal, a labeling re-inspection terminal, a classification terminal, and a re-inspection terminal, the defect inspection method comprising:
Dependencies are inferred from the claim text.