Microscopic imaging method using a correction factor
AssigneeCarl Zeiss Microscopy GmbH
InventorsVIKTOR DRESCHER, Nils LANGHOLZ
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Abstract
A microscopic imaging method, includes illuminating a specimen with illumination radiation and capturing detection radiation along a detection axis. The detection radiation is caused by the illumination radiation, at a first time as a wide-field signal and at a second time as a composite signal. The composite signal is formed by a superposition of a confocal image and a wide-field image; extracting the confocal image by subtracting the wide-field signal from the composite signal, wherein a correction factor is used. A current correction factor is ascertained for each executed imaging and/or for each imaged specimen (1) and the confocal image is extracted using the respective current correction factor.
Claims6
Microscopic imaging method, comprising:
- illuminating a specimen with illumination radiation and capturing detection radiation along a detection axis, said detection radiation having been caused by the illumination radiation, at a first time as a wide-field signal and at a second time as a composite signal,
- forming said composite signal by a superposition of a confocal signal and a wide-field signal,
- extracting the confocal signal by subtracting the wide-field signal from the composite signal, wherein a correction factor is used,
- ascertaining a current correction factor for each executed imaging and/or for each imaged specimen and
- extracting the confocal signal using the respective current correction factor.
Method according to 2, wherein the current correction factor is ascertained from a mean brightnesses of a correction wide-field image and a correction composite image.
Dependencies are inferred from the claim text.