Flexible ceramic coil circuit for high temperature non-destructive inspection
AssigneeOlympus Scientific Solutions Technologies Inc.
InventorsMatthew Edward Stanton, C. Tricia Liu
Life of this patent
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Abstract
Disclosed is a flexible coil circuit for a non-destructive inspection probe. The coil circuit is made of multiple layers of thin flexible ceramic material, each ceramic layer having a metallization layer deposited thereon. The circuit is capable of continuous operation at temperatures up to 350° C. The metallized layers are able to slide freely over one another as the probe is flexed, enabling the probe to conform to the circumference of pipes as small as 2 inches in diameter.
Claims21
A measurement probe comprising:
- at least one layer of an electrically insulation material;
- at least one metallization layer, wherein each of the at least one metallization layer is deposited on a first surface of one of the at least one layer of the insulation material;
- and
- wherein the probe is configured to scan a surface of a test object with a second surface of the one of the at least one layer of the insulation material facing towards the surface of the test object.
A method of making a flexible probe for non-destructive testing (NDT), the method comprising,
- providing two or more layers of an insulation material,
- providing at least one layer of sensor layer,
- stacking the layers of the insulation material and the sensor layer in a fashion to allow inter-layer movement.
A method of making a high temperature probe for non-destructive testing (NDT), the method comprising,
- providing at least one layer of flexible ceramic as an insulation material,
- providing at least one layer of sensor layer,
- stacking the layers of the insulation material and the sensor layer to form the probe, so that the insulation material is facing a test surface of a high temperature object.
Dependencies are inferred from the claim text.