Single wavelength reflection for leadframe brightness measurement
AssigneeTexas Instruments Incorporated
InventorsHung-Yu Chou, Chien-Hao Wang, Tse-Tsun Chiu, Fu-Kang Lee, Liang-Kang Su
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AssigneeTexas Instruments Incorporated
InventorsHung-Yu Chou, Chien-Hao Wang, Tse-Tsun Chiu, Fu-Kang Lee, Liang-Kang Su
Estimating the term…
A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
1-20. (canceled)
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Dependencies are inferred from the claim text.