Manufacturing device control based on metrology data

A device comprising:

• a first communication interface configured to:
• receive a list of topic names from a metrology interface device, the list of topic names corresponding to data generated by multiple metrology devices associated with a manufacturing operation, wherein the metrology interface device is configured to convert metrology data received from the multiple metrology devices to a common format;
• and
• access a data stream from the metrology interface device, the data stream including converted metrology data from the multiple metrology devices and corresponding topic names;
• a processor configured to:
• extract first converted metrology data from the data stream based on a first topic name of the list of topic names, the first converted metrology data generated by converting first metrology data from a first metrology device of the multiple metrology devices to the first converted metrology data having the common format;
• compare the first converted metrology data to a specification;
• and
• detect a condition based on the comparison;
• and
• a second communication interface configured to send a command to a manufacturing device based on the condition.

A computer-readable storage device storing instructions that, when executed by a processor, cause the processor to perform operations comprising:

• receiving a list of topic names from a metrology interface device, the list of topic names corresponding to data generated by multiple metrology devices associated with a manufacturing operation, wherein the metrology interface device is configured to convert metrology data received from the multiple metrology devices to a common format;
• accessing a data stream from the metrology interface device, the data stream including converted metrology data from the multiple metrology devices and corresponding topic names;
• extracting first converted metrology data from the data stream based on a first topic name of the list of topic names, the first converted metrology data generated by converting first metrology data from a first metrology device of the multiple metrology devices to the first converted metrology data having the common format;
• comparing the first converted metrology data to a specification;
• detecting a condition based on the comparison;
• and
• sending a command to a manufacturing device based on the condition.