Detector, surface property measuring machine, and roundness measuring machine
AssigneeTokyo Seimitsu Co., Ltd.
InventorHideki MORII
Life of this patent
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AssigneeTokyo Seimitsu Co., Ltd.
InventorHideki MORII
Estimating the term…
There are provided a detector, a surface property measuring machine and a roundness measuring machine for automatically measuring a plurality of surfaces to shorten the time necessary for measurement. This problem is solved by a detector provided with a stylus for supporting a contact coming in contact with a surface of an object to be measured, a holder configured to hold the stylus, a measuring part configured to hold the holder to be capable of swinging by a rotating shaft and detect a displacement of the holder, and a body configured to accommodate the measuring part, wherein the holder holds the stylus such that a stylus axis as an axis of the stylus and a body axis as an axis of the body are in parallel, and the stylus axis and the body axis are offset in a first direction perpendicular to the body axis and the rotating shaft.
A detector comprising:
A detector comprising:
A detector comprising:
A roundness measuring machine configured to include a surface property measuring machine, the surface property measuring machine comprising:
Dependencies are inferred from the claim text.