Sample container mounting member and sample container sealing method
AssigneeShimadzu Corporation
InventorsHiroshi ARAI, Akinori KOGURE
Life of this patent
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AssigneeShimadzu Corporation
InventorsHiroshi ARAI, Akinori KOGURE
Estimating the term…
A holding member, a sample container, and a mounting member are used in a scanning probe microscope. The mounting member is made of an elastically deformable material such as a rubber material. The mounting member includes an annular main body. When the mounting member is mounted on the holding member and the sample container, the holding member is inserted into the sample container while the main body of the mounting member is elastically deformed along an outer circumferential surface of the sample container. One end of the mounting member is detached from the outer circumferential surface of the sample container, and brought into close contact with an outer circumferential surface of the holding member. When the holding member and the sample container are relatively moved, the main body of the mounting member is elastically deformed.
A sample container mounting member used in a scanning probe microscope, in which a cantilever held by a holding member is brought close to a sample disposed in a bottomed tubular sample container and a surface image of the sample is acquired by scanning the cantilever along a surface of the sample with the holding member inserted into the sample container,
A method for sealing a sample container used in a scanning probe microscope, in which a cantilever held by a holding member is brought close to a sample disposed in a bottomed tubular sample container and a surface image of the sample is acquired by scanning the cantilever along a surface of the sample with the holding member inserted into the sample container, the method comprising:
Dependencies are inferred from the claim text.