Creating Defect Samples for Array Regions
AssigneeKLA-Tencor Corporation
InventorsVidyasagar Anantha, Manikandan Mariyappan, Raghav Babulnath, Gangadharan Sivaraman, Satya Kurada, Thirupurasundari Jayaraman, Prasanti Uppaluri, Srikanth Kandukuri
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