# US 2019/0317145 A1 · Circuit test system and method > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2019/0317145 A1 - Document ID: US20190317145A1 - Status: Published application - Kind: A1 - Application number: 15/993,354 - Filed: 2018-05-30 - Published: 2019-10-17 - Earliest claimed: 2018-04-13 - Assignees: Primax Electronics Ltd. - Applicants: Primax Electronics Ltd. - Inventors: Cheng-Yi Tsai; Ying-Che Tseng - Web page: https://patentgrep.com/patent/US20190317145A1 ## CPC - G01R 1/06794: {Devices for sensing when probes are in contact, or in position to contact, with measured object} - G01R 31/2808: {Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067)} - G01R 1/06722: {Spring-loaded} - G01R 1/07328: {for testing printed circuit boards} - G01L 1/22: using resistance strain gauges - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - G01L: MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE (weighing G01G) ## Abstract A circuit test system is provided for testing a circuit of a circuit board. The circuit test system includes a test platform, a pressing plate and a computing device. The test platform includes plural contact elements. Each contact element includes a strain gauge and a pogo pin. During the process of testing the circuit board, a test program of the computing device monitors and reads a pressure value, a downward displacement and an impedance value of the contact element. Moreover, the test program judges whether the function of the contact element is normal according to the pressure value, the downward displacement and the impedance value. ## Claims ### Claim 1 A circuit test system for testing a circuit of a circuit board, plural test points being formed on the circuit of the circuit board, the circuit test system comprising: a test platform comprising plural contact elements corresponding to the plural test points, wherein each of the plural contact elements comprises a strain gauge and a pogo pin, wherein a pressure value of each of the plural contact elements is detected by the corresponding strain gauge, the pogo pin is disposed on the strain gauge, a downward displacement and an impedance value of each of the plural contact elements are detected by the pogo pin, and the pogo pin is electrically contacted with the corresponding test point; a pressing plate, wherein when the circuit board is pressed by the pressing plate, the plural contact elements are pressed by the corresponding test points; and a computing device electrically connected with the test platform and the pressing plate, wherein a test program is executed in the computing device, wherein when the plural contact elements are electrically contacted with the corresponding test points to test the circuit of the circuit board, the test program monitors and reads the pressure value, the downward displacement and the impedance value and judges whether the pressure value, the downward displacement and the impedance value are equal to a standard pressure value, a standard downward displacement and a standard impedance value, respectively. ### Claim 2 (depends on 1) The circuit test system according to claim 1, wherein the strain gauge comprises a strain plate that detects the pressure value. ### Claim 3 (depends on 1) The circuit test system according to claim 1, wherein the pogo pin comprises: a plunger detecting the impedance value; a spring detecting the downward displacement; and a main body comprising an opening and an accommodation space, wherein the plunger and the spring are accommodated within the accommodation space, and a portion of the plunger is protruded out of the opening and contacted with the spring, so that the plunger is movable within the accommodation space in a reciprocating manner. ### Claim 4 (depends on 1) The circuit test system according to claim 1, wherein when the pogo pin of each contact element is in a completely-released state, the pressure value, the downward displacement and the impedance value read by the test program are respectively defined as the standard pressure value, the standard downward displacement and the standard impedance value corresponding to the completely-released state of the pogo pin. ### Claim 5 (depends on 1) The circuit test system according to claim 1, wherein when the pogo pin of each contact element is in a completely-compressed state, the pressure value, the downward displacement and the impedance value read by the test program are respectively defined as the standard pressure value, the standard downward displacement and the standard impedance value corresponding to the completely-compressed state of the pogo pin. ### Claim 6 (depends on 1) The circuit test system according to claim 1, wherein the test platform comprises plural positioning posts, which are arranged around the plural contact elements, wherein the circuit board comprises plural positioning holes corresponding to the plural positioning posts, and the plural positioning posts are penetrated through the corresponding positioning holes, so that the circuit board is positioned over the plural contact elements. ### Claim 7 (depends on 6) The circuit test system according to claim 6, wherein the plural positioning posts comprise respective base parts and respective positioning ends, wherein the positioning ends are coaxially disposed on the corresponding base parts. ### Claim 8 (depends on 7) The circuit test system according to claim 7, wherein the positioning ends of the positioning posts are penetrated through the corresponding positioning holes, so that the circuit board is movable relative to the positioning ends in a reciprocating manner. ### Claim 9 (depends on 1) The circuit test system according to claim 1, wherein when the test program controls the contact elements to be electrically contacted with the corresponding test points to test the circuit of the circuit board, a test record is generated and stored in the computing device. ### Claim 10 (depends on 9) The circuit test system according to claim 9, wherein if the test program judges that the pressure value, the downward displacement and the impedance value of each of the plural contact elements are not respectively equal to the standard pressure value, the standard downward displacement and the standard impedance value, an abnormal signal is generated and stored in the computing device. ### Claim 11 (depends on 10) The circuit test system according to claim 10, wherein the circuit test system further comprises a control platform, and the test record or the abnormal signal is transmitted from the test program to the control platform in a wired transmission manner or a wireless transmission manner. ### Claim 12 (depends on 11) The circuit test system according to claim 11, wherein the control platform is a cloud server or a mobile device. ### Claim 13 (depends on 12) The circuit test system according to claim 12, wherein the mobile device is a notebook computer, a tablet computer, a personal digital assistant or a smart phone. ### Claim 14 (depends on 1) The circuit test system according to claim 1, wherein plural elastic pressing posts are protruded from a surface of the pressing plate, wherein when the circuit board is pressed by the elastic pressing posts, the plural contact elements are pressed by the corresponding test points. ### Claim 15 A circuit test method for testing a circuit of a circuit board, plural test points being formed on the circuit of the circuit board, the circuit test method comprising steps of: (a) providing a test platform, wherein the test platform comprises plural contact elements, and the plural contact elements comprise plural strain gauges and plural pogo pins on the corresponding strain gauges; (b) calibrating detection values of the strain gauges, so that the pogo pins of the contact elements are located at the same horizontal plane; (c) reading a pressure value, a downward displacement and an impedance value of each of the plural contact elements, and defining the pressure value, the downward displacement and the impedance value as a standard pressure value, a standard downward displacement and a standard impedance value, respectively; (d) storing the standard pressure value, the standard downward displacement and the standard impedance value; (e) loading the standard pressure value, the standard downward displacement and the standard impedance value; (f) testing the circuit board, and monitoring and reading the pressure value, the downward displacement and the impedance value of each of the plural contact elements; (g) judging whether the pressure value, the downward displacement and the impedance value of each of the plural contact elements are respectively equal to the standard pressure value, the standard downward displacement and the standard impedance value, wherein if the judging condition of the step (g) is not satisfied, an abnormal signal is generated, wherein if the judging condition of the step (g) is satisfied, a next step is performed; and (h) generating a test record. ### Claim 16 (depends on 15) The circuit test method according to claim 15, wherein in the step (g), the abnormal signal is transmitted to a control platform in a wired transmission manner or a wireless transmission manner. ### Claim 17 (depends on 15) The circuit test method according to claim 15, wherein in the step (h), the test record is transmitted to a control platform in a wired transmission manner or a wireless transmission manner. ### Claim 18 (depends on 15) The circuit test method according to claim 15, wherein in the step (c), the pressure value, the downward displacement and the impedance value of each contact element corresponding to a completely-released state of the pogo pin are read and defined as the standard pressure value, the standard downward displacement and the standard impedance value corresponding to the completely-released state of the pogo pin. ### Claim 19 (depends on 15) The circuit test method according to claim 15, wherein in the step (c), the pressure value, the downward displacement and the impedance value of each contact element corresponding to a completely-compressed state of the pogo pin are read and defined as the standard pressure value, the standard downward displacement and the standard impedance value corresponding to the completely-compressed state of the pogo pin.