# US 2019/0317035 A1 · Method for inspecting a metal surface and associated device

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- Number: US 2019/0317035 A1
- Document ID: US20190317035A1
- Status: Published application
- Kind: A1
- Application number: 16/313,548
- Filed: 2017-06-29
- Published: 2019-10-17
- Earliest claimed: 2016-06-30
- Assignees: Framatome
- Applicants: Framatome
- Inventors: Yannick CAULIER
- Web page: https://patentgrep.com/patent/US20190317035A1

## CPC

- G01N 25/72: Investigating presence of flaws
- G06T 7/0002: {Inspection of images, e.g. flaw detection}
- G06T 7/0004: {Industrial image inspection}
- G06T 2207/10048: Infrared image
- G06T 2207/30136: Metal
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL

## Abstract

A method for inspecting a metal surface (12) includes providing a first laser source (14) that is arranged to generate a first laser beam having a first wavelength comprised between 1000 nm and 1100 nm and a power higher than 1 W; providing a second laser source (16) that is arranged to generate a second laser beam having a second wavelength comprised between 1500 nm and 1800 nm and a power higher than 1 W; activating one of the first and second laser sources and transmitting the first or second laser beam to the entrance (22) of an optic (18); scanning the metal surface (12) with the laser beam projected by the optic; and acquiring at least one image of the infrared radiation emitted by the metal surface (12).

## Claims

### Claim at position 1

1-10. (canceled)

### Claim 11

A method for inspecting a metal surface of a part, the method comprising the following steps:
procuring a first laser source arranged to generate a first laser beam having a first wavelength comprised between 1000 nm and 1100 nm and a power greater than 1 W;
procuring a second laser source arranged to generate a second laser beam having a second wavelength comprised between 1500 nm and 1800 nm and a power greater than 1 W;
procuring an optic comprising an entrance for a laser beam, and a device arranged to project the laser beam on the metal surface and to scan the metal surface with the laser beam;
activating one of the first and second laser sources and transmitting the first or second laser beam to the entrance of the optic;
scanning the metal surface with the first or second laser beam projected by the optic; and
acquiring at least one image of an infrared radiation emitted by the metal surface.

### Claim 12 (depends on 11)

The inspection method according to claim 11, wherein, during the scanning, the metal surface is heated by the first or second laser beam projected by the optic.

### Claim 13 (depends on 11)

The inspection method according to claim 11, wherein the optic comprises optical elements, the optical elements having a same absorption and transmission properties at the first wavelength and the second wavelength.

### Claim 14 (depends on 13)

The inspection method according to claim 13, further comprising treating an optical surface of at least one of the optical elements, such that the optical element has the same absorption and transmission properties at the first wavelength and the second wavelength.

### Claim 15 (depends on 11)

The inspection method according to claim 11, wherein the method is for inspecting of new parts on a manufacturing site, the first laser source being activated and the first laser beam being transmitted to the entrance of the optic.

### Claim 16 (depends on 11)

The inspection method according to claim 11, wherein the method is for inspecting of parts already in use, the second laser source being activated and the second laser beam being transmitted to the entrance of the optic.

### Claim 17 (depends on 11)

The inspection method according to claim 11, wherein the image of the infrared radiation is acquired by a same sensor for the first laser source and the second laser source.

### Claim 18

A device for inspecting a metal surface of a part, the device comprising:
a first laser source arranged to generate a first laser beam having a first wavelength comprised between 1000 and 1100 nm and a power greater than 1 W;
a second laser source arranged to generate a second laser beam having a second wavelength comprised between 1500 and 1800 nm and a power greater than 1 W;
an optic comprising an entrance for a laser beam and a device arranged to project the laser beam on the metal surface and to scan the metal surface with the laser beam; and
a sensor capable of acquiring at least one image of the infrared radiation emitted by the metal surface,
the first and second laser beams being configured, either one or the other, for transmission to the entrance of the optic.

### Claim 19 (depends on 18)

The inspection device according to claim 18, wherein the optic comprises optical elements, the optical elements having a same absorption and transmission properties at the first wavelength and the second wavelength.

### Claim 20 (depends on 19)

The inspection device according to claim 19, wherein at least one of the optical elements has a treated optical surface, such that the optical element has the same absorption and transmission properties at the first wavelength and the second wavelength.