Memory Cells and Methods of Forming Memory Cells
AssigneeMicron Technology, Inc.
InventorsShuichiro Yasuda, Noel Rocklein, Scott E. Sills, Durai Vishal Nirmal Ramaswamy, Qian Tao
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AssigneeMicron Technology, Inc.
InventorsShuichiro Yasuda, Noel Rocklein, Scott E. Sills, Durai Vishal Nirmal Ramaswamy, Qian Tao
Estimating the term…
Some embodiments include a method of forming a memory cell. A first portion of a switching region is formed over a first electrode. A second portion of the switching region is formed over the first portion using atomic layer deposition. The second portion is a different composition than the first portion. An ion source region is formed over the switching region. A second electrode is formed over the ion source region. Some embodiments include a memory cell having a switching region between a pair of electrodes. The switching region is configured to be reversibly transitioned between a low resistive state and a high resistive state. The switching region includes two or more discrete portions, with one of the portions not having a non-oxygen component in common with any composition directly against it in the high resistive state.
A method of forming a memory cell, comprising:
Dependencies are inferred from the claim text.