Method of making a gallium nitride device
AssigneeInternational Business Machines Corporation
InventorsStephen W. Bedell, Keith E. Fogel, Paul A. Lauro, Devendra K. Sadana
Life of this patent
Estimating the term…
Loading patent…
AssigneeInternational Business Machines Corporation
InventorsStephen W. Bedell, Keith E. Fogel, Paul A. Lauro, Devendra K. Sadana
Estimating the term…
A method of making a GaN device includes: forming a GaN substrate; forming a plurality of spaced-apart first metal contacts directly on the GaN substrate; forming a layer of insulating GaN on the exposed portions of the upper surface; forming a stressor layer on the contacts and the layer of insulating GaN; forming a handle substrate on the first surface of the stressor layer; spalling the GaN substrate that is located beneath the stressor layer to separate a layer of GaN and removing the handle substrate; bonding the stressor layer to a thermally conductive substrate; forming a plurality of vertical channels through the GaN to define a plurality of device structures; removing the exposed portions of the layer of insulating GaN to electrically isolate the device structures; forming an ohmic contact layer on the second surface; and forming second metal contacts on the ohmic contact layer.
A semiconductor device comprising:
Dependencies are inferred from the claim text.