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US 2019/0295677 A1Published application
Determining line functionality according to line quality in nv storage
AssigneeWestern Digital Technologies, Inc.
InventorsRefael BEN-RUBI, Moshe COHEN
Life of this patent
Estimating the term…
Abstract
An apparatus and method are described to determine line functionality between two electrical circuits to enable the line to run at a maximum frequency without deleterious conditions occurring from cross-talk effects.
Claims28
A method testing an interface between a first electrical circuit and a second electrical circuit, comprising:
- transmitting a data pattern on at least a first line from the first electrical circuit to the second electrical circuit at a transmitting frequency;
- receiving the data pattern with a received data pattern at the second electrical circuit;
- increasing a value of a counter by one;
- comparing the received data pattern at the second electrical circuit to an expected data pattern to obtain a result;
- decreasing a value of the transmitting frequency to an augmented transmitting frequency when the result is indicates that the data pattern on the first line is different than the received data pattern;
- increasing a value of the transmitting frequency to an augmented transmitted frequency when the result indicates that the data pattern on the first line is not different than the received data pattern;
- determining if the counter has reached a threshold limit;
- reporting the augmented transmitted frequency to the first electrical circuit when the counter has reached the threshold limit;
- and
- reconfiguring the first electrical circuit to send data on the at least the first line at the augmented transmitting frequency.
7 more elements
An arrangement for testing lines between two electrical circuits, comprising:
- an application specific integrated circuit configured to send and receive data patterns;
- an interface module connected to the application specific integrated circuit configured to send and receive data patterns;
- and
- a flash memory configured with a connection to the interface module, the flash memory having a comparing circuit, wherein the comparing circuit is configured to compare a received data pattern at the flash memory and an expected data pattern.
1 more element
An arrangement, comprising:
- a means for transmitting a data pattern on a line from the first electrical circuit to the second electrical circuit at a transmitting frequency;
- a means for receiving a received data pattern at the second electrical circuit;
- a means for comparing the received data pattern to an expected data pattern to obtain a result;
- and
- a means for decreasing a value of the transmitting frequency to an augmented transmitting frequency when the result is indicates that the data pattern on the first line is different than the received data pattern and increasing a value of the transmitting frequency to an augmented transmitted frequency when the result indicates that the data pattern on the line is not different than the received data pattern.
2 more elements
A method for testing a line between a first electrical circuit and a second electrical circuit, comprising:
- transmitting a data pattern on the line at a transmitting frequency;
- receiving the data pattern with a received data pattern at the second electrical circuit;
- comparing the received data pattern to an expected data pattern by the second electrical circuit;
- increasing a loop counter by one;
- decreasing a value of the transmitting frequency to an augmented transmitting frequency when the data pattern on the line is different than the received data pattern;
- increasing a value of the transmitting frequency to an augmented transmitted frequency when the data pattern on the line is not different than the received data pattern;
- and
- repeating the transmitting of the data pattern on the line at the augmented transmitted frequency, the receiving of the data pattern, the comparing the received data pattern, the increasing the loop counter, the decreasing the value of the transmitting frequency and the increasing the value of the transmitting frequency until a threshold is reached for the counter.
5 more elements
A method for testing a transmission of a signal between a first electrical circuit and a second electrical circuit, comprising:
- transmitting a signal on a line extending between the first electrical circuit and the second electrical circuit at a transmitting frequency;
- receiving the signal with a received pattern at the second electrical circuit;
- comparing the received pattern to an expected pattern by the second electrical circuit;
- increasing a loop counter by one;
- decreasing a value of the transmitting frequency to an augmented transmitting frequency when the pattern on the line is different than the received pattern;
- increasing a value of the transmitting frequency to an augmented transmitted frequency when the data pattern on the line is not different than the received pattern;
- and
- repeating the transmitting of the data pattern on the line at the augmented transmitted frequency, the receiving of the pattern, the comparing the received pattern, the increasing the loop counter, the decreasing the value of the transmitting frequency and the increasing the value of the transmitting frequency until a threshold is reached for the counter.
5 more elements
Dependencies are inferred from the claim text.