Dynamic power analysis with per-memory instance activity customization

A circuit, comprising:

• a built-in self test (BIST) control configured to route a plurality of activity factors to a BIST circuit, wherein:
• the BIST circuit includes at least one activity register configured to store a programmable value, and
• the BIST circuit is configured to run a BIST pattern in a loop mode on a memory and measure dynamic power on a supply while running the BIST pattern in the loop mode on the memory,
• wherein the at least one activity register comprises a read activity register, a write activity register, a search activity register, and any other modes register.

A method comprising:

• inputting a plurality of activity factors to a built-in-self-test (BIST) circuit to define a BIST pattern;
• exercising the BIST pattern in a loop mode on a memory;
• measuring current on a supply while exercising the BIST pattern in the loop mode on the memory;
• and
• calculating dynamic power on the supply based on the measured current on the supply while exercising the BIST pattern in the loop mode on the memory,
• wherein the activity factors include a read activity factor, a write activity factor, a search activity factor, and any other modes activity factor which corresponds to a read operation, a write operation, a search operation, and any other modes of operation.