Distance measurement using projection patterns of varying densities
AssigneeMagik Eye Inc.
InventorAkiteru Kimura
Life of this patent
Estimating the term…
Abstract
In one example, a method includes instructing a pattern projector of a distance sensor to project a pattern of light onto the object, wherein the pattern comprise a plurality of parallel rows of projection artifacts, and wherein a spatial density of the projection artifacts in a first row of the plurality of parallel rows is different from a spatial density of the projection artifacts in a second row of the plurality of parallel rows, instructing a camera of the distance sensor to acquire an image of the object, where the image includes the pattern of light, and calculating a distance from the distance sensor to the object based on an analysis of the image.
Claims20
A method, comprising:
- instructing, by a processing system of a distance sensor, a pattern projector of the distance sensor to project a pattern of light onto the object, wherein the pattern comprise a plurality of parallel rows of projection artifacts, and wherein a spatial density of the projection artifacts in a first row of the plurality of parallel rows is different from a spatial density of the projection artifacts in a second row of the plurality of parallel rows;
- instructing, by the processing system, a camera of the distance sensor to acquire an image of the object, where the image includes the pattern of light;
- and
- calculating, by the processing system, a distance from the distance sensor to the object based on an analysis of the image.
A non-transitory machine-readable storage medium encoded with instructions executable by a processor of a distance sensor, wherein, when executed, the instructions cause the processor to perform operations, the operations comprising:
- instructing a pattern projector of the distance sensor to project a pattern of light onto the object, wherein the pattern comprise a plurality of parallel rows of projection artifacts, and wherein a spatial density of the projection artifacts in a first row of the plurality of parallel rows is different from a spatial density of the projection artifacts in a second row of the plurality of parallel rows;
- instructing a camera of the distance sensor to acquire an image of the object, where the image includes the pattern of light;
- and
- calculating a distance from the distance sensor to the object based on an analysis of the image.
A distance sensor, comprising:
- a pattern projector to project a pattern of light onto an object, wherein the pattern comprise a plurality of parallel rows of projection artifacts, and wherein a spatial density of the projection artifacts in a first row of the plurality of parallel rows is different from a spatial density of the projection artifacts in a second row of the plurality of parallel rows;
- a camera to acquire an image of the object, where the image includes the pattern of light;
- and
- a processing system to calculate a distance from the distance sensor to the object based on an analysis of the image.
Dependencies are inferred from the claim text.