Systems and methods for detecting bit rot in distributed storage devices having failure domains

A system for detecting bit rot in distributed storage devices having failure domains, the system comprising:

• a first receiving module, stored in a memory, that receives a combination of data chunks created by adding, for each failure domain storing data chunks, data chunks from different stripes;
• a second receiving module, stored in the memory, that receives a combination of parity chunks created by adding, for each failure domain storing parity chunks, parity chunks from the different stripes;
• a creating module, stored in the memory, that creates at least one new parity chunk from the combination of data chunks;
• an identifying module, stored in the memory, that identifies a presence of bit rot in the failure domains when the at least one new parity chunk does not match the received combination of parity chunks;
• and
• at least one physical processor that executes the first receiving module, the second receiving module, the creating module, and the identifying module.

A non-transitory computer-readable medium comprising one or more computer-executable instructions that, when executed by at least one processor of a computing device, cause the computing device to:

• receive, at the computing device, a combination of data chunks created by adding, for each failure domain storing data chunks, data chunks from different stripes;
• receive a combination of parity chunks created by adding, for each failure domain storing parity chunks, parity chunks from the different stripes;
• create at least one new parity chunk from the combination of data chunks;
• and
• identify a presence of bit rot in the failure domains when the at least one new parity chunk does not match the received combination of parity chunks.