Beam scanning apparatus and optical apparatus including the same
AssigneeSamsung Electronics Co., Ltd.
InventorsJunghyun PARK, Jungwoo KIM, Byunggil JEONG, Changgyun SHIN, Byounglyong CHOI
Life of this patent
Estimating the term…
Abstract
A beam scanning apparatus includes a light source configured to emit light, and a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of the reflected light reflected by the reflective phased array device, wherein the light source and the reflective phased array device are disposed such the light is incident on the reflective phased array device at an incidence angle with respect to a normal of a reflective surface of the reflective phased array device.
Claims27
A beam scanning apparatus comprising:
- a light source configured to emit light;
- and
- a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of reflected light reflected by the reflective phased array device,
- wherein the light source and the reflective phased array device are disposed such that the light is incident on the reflective phased array device at an incidence angle with respect to a normal of a reflective surface of the reflective phased array device.
An optical apparatus comprising:
- a light source configured to emit light;
- a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of reflected light reflected by the reflective phased array;
- and
- a light detector configured to detect light reflected by an external object which is irradiated with the reflected light from the reflective phased array device,
- wherein the light source and the reflective phased array device are disposed such that the light is incident on the reflective phased array device at an incidence angle with respect to a normal of a reflective surface of the reflective phased array device.
A beam scanning apparatus comprising:
- a light source configured to emit light;
- and
- a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of reflected light reflected by the reflective phased array device, the reflective phased array device comprising a plurality of antenna layers,
- wherein the light source and the reflective phased array device are disposed such the light is incident on the reflective phased array device at an incident angle with respect to a normal of a reflective surface of the reflective phased array device,
- wherein the reflected light comprises directly reflected light directly that is reflected by the reflective phased array device and resonated scattered light that is generated based on resonance in each of a plurality of antenna resonators of the reflective phased array device, and
- wherein at least one of an interval between the plurality of antenna layers or an antenna period is determined such that an intensity of the directly reflected light is equal to an intensity of the resonated scattered light.
Dependencies are inferred from the claim text.