Optoelectronic measuring device having scanning functionality

An optoelectronic measuring device comprising:

• a pulsed radiation source generating a measuring beam from light pulses at a light pulse emission rate;
• an optical unit which emits the light pulses into free space onto a target object;
• a beam deflector which varies the emission direction of the light pulses about at least one axis so as to perform a scan sampling of the target object, wherein a scanning grid is formed from scanning points;
• at least one position or angle sensor for measuring the emission direction;
• an optoelectronic detector which detects light pulses reflected from the target object;
• a control and analysis unit which measures a distance value from a respective scanning point of the target object according to the time-of-flight principle, wherein a number (n, where n>=1) of detected light pulses is used for the measurement,
• wherein the control and analysis unit automatically sets the number (n) of the light pulses depending on at least one target-object-related measured value determined by the measuring device in real time.

An optoelectronic measuring method for optically sampling a target object, the method comprising:

• emitting a pulsed measuring beam onto the target object to be sampled with variation of the emission direction of the light pulses about at least one axis, such that scanning sampling of the target object is executable, wherein a scanning grid is formed from scanning points;
• measuring the emission direction;
• detecting light pulses reflected from the target object;
• and
• measuring a distance value from a respective scanning point of the target object according to the time-of-flight principle, wherein a number (n, where n>=1) of detected light pulses is used for the measurement,
• wherein the number (n) of the light pulses used for the measurement is automatically set in dependence on a target-object-related measured value determined in real time.