Electromagnetic wave measurement point calculation device and radiation interference wave measurement device
AssigneeTDK Corporation
InventorsMasataka MIDORI, Hiroshi KURIHARA, Tomohiro HONYA
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AssigneeTDK Corporation
InventorsMasataka MIDORI, Hiroshi KURIHARA, Tomohiro HONYA
Estimating the term…
An electromagnetic wave measurement point calculation device of the present invention is an electromagnetic wave measurement point calculation device that is configured to calculate a plurality of measurement points of an electromagnetic wave set on a surface surrounding a radiation source of the electromagnetic wave. The electromagnetic wave measurement point calculation device includes an arithmetic processing unit configured to calculate a measurement interval between a first measurement point and a second measurement point adjacent to the first measurement point using a correction coefficient determined according to the first measurement point and execute an electromagnetic wave measurement point calculation process for sequentially calculating the plurality of measurement points in a measurement range.
An electromagnetic wave measurement point calculation device that is configured to calculate a plurality of measurement points of an electromagnetic wave set on a surface surrounding a radiation source of the electromagnetic wave, the electromagnetic wave measurement point calculation device comprising:
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