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US 2019/0293684 A1Published application
Contact conduction jig and inspection device
AssigneeNidec-Read Corporation
InventorKiyoshi NUMATA
Life of this patent
Estimating the term…
Abstract
An inspection jig may include: a support plate including a plate-shaped member and having a plurality of through holes extending along a thickness of the support plate; a plurality of probes each having a tubular shape and conductivity, the probes being respectively inserted into the through holes; and an elastomer elastically holding the probes in the through holes. Each of the probes may include a first spring part wound helically in a first direction and configured to expand and contract along an axis of the probe.
Claims20
A contact conduction jig comprising:
- a support plate comprising a plate-shaped member and a plurality of through holes extending along a thickness of the support plate;
- a plurality of tubular bodies that are each electrically conductive, each tubular body of the plurality of tubular bodies inserted into a respective through hole of the plurality of through holes;
- and
- a holding member elastically holding the plurality of tubular bodies in the respective through holes of the plurality of through holes,
- wherein
- each tubular body of the plurality of tubular bodies comprises a first spring part wound helically in a first direction and configured to expand and contract along an axis of the tubular body.
3 more elements
Dependencies are inferred from the claim text.