Conductive particle-disposed film, method for producing the same, test probe unit, and continuity test method

Abstract

A conductive particle-disposed film of the present invention useful for a test probe unit for a continuity test of a fine-pitch continuity test object such as a semiconductor device is configured so that conductive particles are disposed in the surface direction of the elastomer film. The thickness of the elastomer film approximately coincides with the average particle diameter of the conductive particles. Ends of the conductive particles are positioned in the vicinity of respective outermost faces of both surfaces of the elastomer film. The same or different conductive particle-disposed films may be layered. A pressure-sensitive adhesive layer may be formed on at least one surface of the conductive particle-disposed film.

Dependencies are inferred from the claim text.