Foreign substance inspection apparatus, processing apparatus, and method of manufacturing article
AssigneeCanon Kabushiki Kaisha
InventorKenichi Kobayashi
Life of this patent
Estimating the term…
Loading patent…
AssigneeCanon Kabushiki Kaisha
InventorKenichi Kobayashi
Estimating the term…
A foreign substance inspection apparatus performs foreign substance detection processing of detecting a foreign substance present on a surface of a substrate. The apparatus includes a detector that includes a projector configured to project light onto the surface and an optical receiver configured to receive scattered light from the surface, a scanning mechanism configured to scan a position on the surface onto which the light is projected by the projector, and a controller configured to control the foreign substance detection processing so that detection of the foreign substance is performed on a detection region which is a region excluding, from the surface, an exclusion region where a step is present thereon, wherein the controller controls the projection by the projector so that light is not projected to the step.
A foreign substance inspection apparatus that performs foreign substance detection processing of detecting a foreign substance present on a surface of a substrate, comprising:
A method of manufacturing an article, comprising:
Dependencies are inferred from the claim text.