Automatic optical inspection device and method
AssigneeShanghai Micro Electronics Equipment (Group) Co., Ltd.
InventorsHailiang LU, Junwei JIA, Pengli ZHANG, Hongji ZHOU, Wen XU, Fan WANG
Life of this patent
Estimating the term…
Loading patent…
AssigneeShanghai Micro Electronics Equipment (Group) Co., Ltd.
InventorsHailiang LU, Junwei JIA, Pengli ZHANG, Hongji ZHOU, Wen XU, Fan WANG
Estimating the term…
An automatic optical inspection (AOI) device and method are disclosed. The device is adapted to inspect an object under inspection (OUI) (102) carried on a workpiece stage (101) and includes: a plurality of detectors (111, 112) for capturing images of the OUI (102); a plurality of light sources (121, 122) for illuminating the OUI (102) in different illumination modes; and a synchronization controller (140) signal-coupled to both the plurality of detectors (111, 112) and the plurality of light sources (121, 122). The synchronization controller (140) is configured to directly or indirectly control the plurality of detectors (111, 112) and the plurality of light sources (121, 122) based on the position of the OUI (102) so that each of them is individually activated and deactivated according to a timing profile, that each of the detectors (111, 112) is able to capture images of the OUI (102) in an illumination mode provided by a corresponding one of the light sources (121, 122), and that when any one of the light sources (121, 122) is illuminating the OUI (102), only the one of the detectors (111, 112) corresponding to this light source (121, 122) is activated. Through the timing control over the multiple light sources (121, 122) and detectors (111, 112) by the synchronization controller (140), inspection with multiple measurement configurations can be accomplished within a single scan, resulting in a significant improvement in inspection efficiency.
An automatic optical inspection device for inspecting an object under inspection carried on a workpiece stage, comprising:
An automatic optical inspection (AM) method for inspecting an object under inspection carried on a workpiece stage, comprising:
Dependencies are inferred from the claim text.