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US 2019/0293549 A1Published application
Optical probe based on thin-film interference
AssigneeResearch & Business Foundation Sungkyunkwan University
InventorsMyunghwan CHOI, YongJae JO, Junhwan KWON
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Abstract
The present disclosure relates to a method of analysis by an optical marker, including: irradiating a broadband light source onto a spherical dielectric material; measuring an interference spectrum of reflected light from the spherical dielectric material; and analyzing the reflected light using thin-film interference theory.
Claims13
A method of analysis by an optical marker, comprising:
- irradiating a broadband light source onto a spherical dielectric material;
- measuring an interference spectrum of reflected light from the spherical dielectric material;
- and
- analyzing the reflected light using the thin-film interference theory.
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Dependencies are inferred from the claim text.