X-ray utilized compound measuring apparatus

Abstract

There is provided an X-ray utilized compound measuring apparatus in which troublesome tasks required to dispose a measurement object are reduced and the accuracy or the validity of measurements on multiple kinds of measurement can be improved. The X-ray utilized compound measuring apparatus comprises an X-ray generator 10 that outputs X-rays, a reflected-wave detector 12 that detects a reflected wave of the X-rays emitted from the X-ray generator 10 and reflected by a measurement object 21, a transmitted-wave detector 11 that detects a transmitted wave of the X-rays emitted from the X-ray generator 10 and passing through the measurement object 21, and a control unit that controls the X-ray generator 10 to output X-rays and performs computational processing for obtaining measurement values of a plurality of items on the measurement object 21 using a reflected-wave detection signal output from the reflected-wave detector 12 and representing the reflected wave and a transmitted-wave detection signal output from the transmitted-wave detector 11 and representing the transmitted wave and also performs computational processing for component analysis.

Dependencies are inferred from the claim text.