Method and device for analysing an electromagnetic wave in high definition

Device for analysing an electromagnetic wave, comprising:

• a diffractive element arranged in order to receive an incident electromagnetic wave and in order to convert this incident electromagnetic wave into a diffracted electromagnetic wave,
• a matrix-array sensor having a matrix array of pixels aligned along one or two axis or axes of alignment of pixels, said sensor being arranged in order to receive an interference pattern of the diffracted electromagnetic wave originating from the diffractive element,
• the device comprising displacement means arranged in order to modify the relative position between the diffractive element and the matrix-array sensor, said device being arranged in order to carry out several acquisitions, by the matrix-array sensor, of a signal of the diffracted electromagnetic wave corresponding to several relative positions between the diffractive element and the matrix-array sensor,
• the device comprising processing means arranged and/or programmed in order to calculate, from the several acquisitions corresponding to the several relative positions between the diffractive element and the matrix-array sensor, a value for the intensity and/or phase gradient and/or phase for different points of interest of the incident electromagnetic wave,
• characterized in that the diffractive element is arranged in order to generate at least three diffraction orders of the incident electromagnetic wave up to the sensor.