Appearance inspection system, image processing device, imaging device, and inspection method
AssigneeOMRON Corporation
InventorsYutaka Kato, Yasuhito Uetsuji
Life of this patent
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AssigneeOMRON Corporation
InventorsYutaka Kato, Yasuhito Uetsuji
Estimating the term…
An appearance inspection system includes a setting part, a movement mechanism, and a control part. The setting part sets a route passing through a plurality of imaging positions in order. The setting part sets the route so that a first time necessary for the movement mechanism to move an imaging device from a first imaging position to a second imaging position among the plurality of imaging positions is longer than a second time necessary for a process of changing a first imaging condition corresponding to the first imaging position to a second imaging condition corresponding to the second imaging position by the control part. The control part starts the process of changing the first imaging condition to the second imaging condition earlier by the second time or more than a scheduled time at which the imaging device arrives at the second imaging position.
An appearance inspection system that performs appearance inspection by causing an imaging device to image a target when the imaging device arrives at each of a plurality of imaging positions set for the target while moving a relative position of the imaging device with respect to the target, the appearance inspection system comprising:
An inspection method of performing appearance inspection by causing an imaging device to image a target when the imaging device arrives at each of a plurality of imaging positions set for the target while moving the imaging device, the inspection method comprising:
Dependencies are inferred from the claim text.