Electrical parameters of isotopes
AssigneeHewlett-Packard Development Company, L.P.
InventorsPAUL HOWARD MAZURKIEWICZ, NING GE, HELEN A. HOLDER
Life of this patent
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Abstract
An example device includes an isotope portion including a material having at least one isotope, a reaction control portion to cause a chemical reaction including the at least one isotope, and an electrical parameter portion to measure a change in an electrical parameter to determine a change in an amount of the material having the at least one isotope, the electrical parameter to change based on the chemical reaction.
Claims15
A device, comprising:
- an isotope portion including a material having at least one isotope;
- a reaction control portion to cause a chemical reaction including the at least one isotope;
- and
- an electrical parameter portion to measure a change in an electrical parameter to determine a change in an amount of the material having the at least one isotope, the electrical parameter to change based on the chemical reaction.
A method, comprising:
- measuring an electrical parameter associated with a decaying isotope, the electrical parameter being used to determine a present level of the decaying isotope;
- comparing the determined present level of the decaying isotope to a reference level of the decaying isotope corresponding to a reference time;
- and
- calculating an elapsed time since the reference time based on the determined present level, the reference level and a half-life associated with the decaying isotope.
A non-transitory computer-readable storage medium encoded with instructions executable by a processor of a computing system, the computer-readable storage medium comprising instructions to:
- cause a chemical reaction of a material including at least one isotope;
- measure an electrical parameter to determine an amount of the material including the at least one isotope, the electrical parameter being based on the chemical reaction;
- and
- calculate an isotope level and/or ratio of the at least one isotope.
Dependencies are inferred from the claim text.