Cmp polishing pad conditioner
AssigneesSinmat, Inc., University of Florida Research Foundation, Inc.
InventorsRAJIV K. SINGH, DEEPIKA SINGH
Life of this patent
Estimating the term…
Loading patent…
AssigneesSinmat, Inc., University of Florida Research Foundation, Inc.
InventorsRAJIV K. SINGH, DEEPIKA SINGH
Estimating the term…
A method of processing chemical mechanical polishing (CMP) pad conditioners includes providing the CMP pad conditioner including conditioner substrate that is a metal, ceramic or a metal-ceramic material with a plurality of hard conditioner particles with a Vickers hardness greater than 3,000 Kg/mm2 bonded to a top surface of the conditioner substrate, and a slurry including an aqueous medium and a plurality of hard slurry particles having a hardness greater than 3,000 Kg/mm2. The surface of the pad conditioner is polished in a CMP apparatus using a polishing pad. After the polishing each conditioner particle has at least one exposed facet, and the plurality of hard conditioner particles have a maximum average protrusion-to-protrusion flatness (PPF) difference of 20 microns, and a sharpest edge measured by a value of a cutting edge radius (CER) that lies at an edge of the facet for at least 80% of the facets.
A chemical mechanical polishing (CMP) pad conditioner, comprising:
A chemical mechanical polishing (CMP) pad conditioner, comprising:
A method of processing a chemical mechanical polishing (CMP) pad conditioner, comprising:
A method of processing a chemical mechanical polishing (CMP) pad conditioner, comprising:
Dependencies are inferred from the claim text.