Apparatuses and methods for indirectly detecting phase variations
AssigneeMicron Technology, Inc.
InventorHiroki Takahashi
Life of this patent
Estimating the term…
Abstract
Apparatuses and methods for indirect phase variation detection are disclosed herein. An example apparatus may include a clock generator circuit comprising a delay-locked loop (DLL) circuit configured to adjust a phase of a clock signal based on a phase of a feedback clock signal during an initial phase-lock operation. The DLL circuit includes a phase deviation detection circuit configured to detect a variation in a phase of the clock signal based on variations in gate delays of an oscillation circuit, and to initiate a subsequent phase-lock operation in response to detecting variations in the gate delays of the oscillation circuit.
Claims20
An apparatus, comprising:
- a phase deviation detection circuit configured to detect a variation in a phase of a clock signal based on variations in gate delays of an oscillation circuit, and to initiate a phase-lock operation in response to detecting variations in the gate delays of the oscillation circuit.
An apparatus comprising:
- an oscillator configured to output an internal clock signal;
- and
- a detector configured to compare count values of the internal clock signal over first and second time periods and to initiate adjustment of a phase of a clock signal based on the comparison.
A method comprising:
- detecting variation in gate delays of an oscillation circuit;
- and
- in response to detection that the variation in the gate delays of the oscillation circuit exceed a threshold, initiating a phase-lock operation associated with a clock signal.
Dependencies are inferred from the claim text.