Inspection method of electrical storage device and manufacturing method thereof

An inspection method of an electrical storage device, the inspection method comprising:

• setting a pseudo parasitic resistance value to be small in a case where a power storage capacity of the electrical storage device is large, as compared to a case where the power storage capacity is small, while setting the pseudo parasitic resistance value to be large in the case where the power storage capacity of the electrical storage device is small, as compared to the case where the power storage capacity is large, the pseudo parasitic resistance value being obtained by dividing, by a current value of a circuit, an excessive amount of a voltage value of an external power source with respect to an initial voltage value of the electrical storage device;
• in a state where the pseudo parasitic resistance value is set, acquiring a current value after convergence of a current flowing through the circuit such that the circuit is formed by connecting the external power source to the electrical storage device in a direction where a voltage of the external power source is applied to the electrical storage device;
• and
• determining quality of the electrical storage device based on the current value.