Auto-referenced memory cell read techniques
AssigneeMicron Technology, Inc.
InventorsGraziano Mirichigni, Marco Sforzin, Alessandro Orlando
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AssigneeMicron Technology, Inc.
InventorsGraziano Mirichigni, Marco Sforzin, Alessandro Orlando
Estimating the term…
Methods, systems, and devices related to auto-referenced memory cell read techniques are described. The auto-referenced read may encode user data to include a certain number bits having a first logic state prior to storing the user data in memory cells. Subsequently, reading the encoded user data may be carried out by applying a read voltage to the memory cells while monitoring a series of switching events by activating a subset of the memory cells having the first logic state. The auto-referenced read may identify a particular switching event that correlates to a median threshold voltage value of the subset of the memory cells. Then, the auto-referenced read may determine a reference voltage that takes into account a statistical property of threshold voltage distribution of the subset of the memory cells. The auto-referenced read may identify a time duration to maintain the read voltage based on determining the reference voltage. When the time duration expires, the auto-referenced read may determine that the memory cells that have been activated correspond to the first logic state.
A method, comprising:
A method, comprising:
An electronic memory apparatus, comprising:
An electronic memory apparatus, comprising:
Dependencies are inferred from the claim text.