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US 2019/0197933 A1Published application
Pixel structure for repairing defects for micro device integrated systems
AssigneeVueReal Inc.
InventorGHOLAMREZA CHAJI
Life of this patent
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Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Claims14
A repair structure on a system substrate comprising:
- a pixel circuit;
- at least one repair contact pad disposed on the system substrate;
- and
- at least one fuse coupling the pixel circuit to the at least one repair contact pad and a micro device.
1 more element
A method of repairing a system comprising at least one of:
- a defective circuit or micro device, the method comprising:
- identifying the defective circuit or micro device;
- populating a repair contact pad corresponding to the defective circuit or micro device with a spare micro device;
- connecting the repair pad to a corresponding pixel circuit;
- disabling the defective circuit or micro device.
2 more elements
A method of repairing a system comprising a defective circuit or micro device, the method comprising:
- identifying the defective circuit or micro device;
- populating a repair contact pad corresponding to the defective circuit or micro device, the repair pad associated with a spare circuit;
- and
- disabling the defective circuit or micro device.
1 more element
Dependencies are inferred from the claim text.