Display device, test circuit, and test method thereof
AssigneeLG Display Co., Ltd.
InventorsBeom-Jin KIM, Sunkyung SHIN, Bongchoon KWAK, Sojung JUNG
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AssigneeLG Display Co., Ltd.
InventorsBeom-Jin KIM, Sunkyung SHIN, Bongchoon KWAK, Sojung JUNG
Estimating the term…
The embodiments of the present disclosure relate to a display device, a test circuit, and a test method thereof. More specifically, a display device may include a silicon substrate having a plurality of gate lines, a plurality of data lines, a plurality of sensing lines, and a pixel array on which a plurality of subpixels are arranged; a test circuit arranged on the silicon substrate, the test circuit configured to select at least one line of the plurality of data lines or the plurality of sensing lines, to convert a signal transmitted through the selected line into a digital signal, and to output test data; and a test pad unit configured to output the test data to a circuit outside the silicon substrate.
A display device, comprising:
A test circuit of a microdisplay device which is arranged on a silicon substrate, wherein the test circuit selects at least one line of a plurality of data lines or a plurality of sensing lines arranged on a pixel array, converts a signal transmitted through the selected line into a digital signal to acquire test data, and outputs the acquired test data through a test pad unit arranged on the silicon substrate.
A method of testing a microdisplay device including a silicon substrate configured to include a plurality of gate lines, a plurality of data lines, a plurality of sensing lines, and a pixel array on which a plurality of subpixels are arranged;
Dependencies are inferred from the claim text.