Object inspection system and object inspection method
AssigneeFanuc Corporation
InventorsJunichirou YOSHIDA, Fumikazu WARASHINA
Life of this patent
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AssigneeFanuc Corporation
InventorsJunichirou YOSHIDA, Fumikazu WARASHINA
Estimating the term…
An object inspection system enabling a quick and easy registering of a master image and an inspection image when there is a displacement between the master image and the inspection image. The object inspection system includes an imaging section, a movement machine configured to move a first object or a second object and an imaging section relative to each other, a positional data acquisition section configured to acquire positional data of the movement machine when the movement machine disposes the first object or the second object and the imaging section at a relative position, an image data acquisition section configured to acquire a first image of the first object and a second image of the second object, and an image registering section configured to register the first image and the second image.
An object inspection system comprising:
An object inspection method comprising:
Dependencies are inferred from the claim text.