Method, device and electronic apparatus for testing capability of analyzing a two-dimensional code
AssigneeZhuhai Juntian Electronic Technology Co., Ltd.
InventorChao Wang
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AssigneeZhuhai Juntian Electronic Technology Co., Ltd.
InventorChao Wang
Estimating the term…
The embodiments of the present application disclose a method, a device and an electronic apparatus for testing capability of analyzing a two-dimensional code. The method comprises: performing an analysis on a two-dimensional code to be tested to obtain a result string; recording a duration of the present analysis; updating a total test duration based on the duration of the present analysis; determining whether the present analysis is correct; updating the number of correct analyses if the present analysis is correct; determining whether the updated total test duration is not less than a preset duration; determining a test result based on the updated number of correct analyses and the updated total test duration if the updated total test duration is not less than the preset duration, so as to intuitively reflect the capability of the electronic apparatus analyzing a two-dimensional code.
A method for testing capability of analyzing a two-dimensional code, comprising:
A device for testing capability of analyzing a two-dimensional code, comprising:
An electronic apparatus, comprising:
Dependencies are inferred from the claim text.