Method and system for measuring a phase baseline estimate of an input device

A method, comprising:

• obtaining a first resulting signal and a second resulting signal from a plurality of sensor electrodes, wherein the plurality of sensor electrodes define a plurality of sensor pixels;
• determining, using the first resulting signal, an in-phase estimate of a phase delay at a sensor pixel among the plurality of sensor pixels;
• determining, using the second resulting signal, a quadrature estimate of the phase delay at the sensor pixel;
• and
• determining, based at least in part on the in-phase estimate and the quadrature estimate, a phase baseline estimate of the plurality of sensor pixels.

An input device, comprising:

• a plurality of transmitter electrodes;
• a plurality of receiver electrodes, wherein the plurality of transmitter electrodes and the plurality of receiver electrodes define a plurality of sensor pixels within the input device;
• and
• a processing system coupled to the plurality of transmitter electrodes and the plurality of receiver electrodes, the processing system configured to:
• transmit a dither sensing signal along a transmitter electrode among the plurality of transmitter electrodes, wherein the dither sensing signal comprises a predetermined amount of phase noise that is produced according to a dither function;
• obtain a resulting signal from a receiver electrode among the plurality of receiver electrodes in response to transmitting the dither sensing signal;
• determine, using the resulting signal and the dither function, an in-phase estimate of a phase delay at a sensor pixel and a quadrature estimate of the phase delay at the sensor pixel;
• and
• determine, based at least in part on the in-phase estimate and the quadrature estimate, a phase baseline estimate of the plurality of sensor pixels.