Production system
AssigneeRenesas Electronics Corporation
InventorsKazuyuki TOKOROZUKI, Toshihiro NAKAJIMA
Life of this patent
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Abstract
A sensor monitors a treatment status of a predetermined manufacturing device, and an abnormality detection device detects an abnormality of a sensor signal that is a monitoring result of the sensor. The sensor signal is a digital data group obtained by sampling an analog waveform at a predetermined sampling period. A management apparatus learns characteristics of a plurality of digital data groups accumulated in past times through use of artificial intelligence to generate a learned model. An abnormality detection device holds the learned model and determines whether an abnormality is present in the digital data group of a current processing target by using the learned model.
Claims8
1-16. (canceled)
A production system for manufacturing a product, the production system comprising:
- a manufacturing device performing treatment associated with manufacturing processes;
- a master device managing the entire production system;
- a sensor corresponding to the manufacturing device and monitoring a treatment status of the manufacturing device;
- an abnormality detection device corresponding to the manufacturing device and detecting an abnormality of a sensor signal that is a monitoring result of the sensor;
- and
- a communication network connecting the manufacturing device, the master device, and the abnormality detection device,
- wherein the master device learns characteristics of a plurality of the sensor signals accumulated in past times through use of artificial intelligence to generate a learned model for determining whether an abnormality is present in the sensor signal, and
- wherein the abnormality detection device holds the generated learned model and determines whether an abnormality is present in the sensor signal, which is a current processing target, by using the held learned model.
Dependencies are inferred from the claim text.