Structured illuminating microscopy apparatus
AssigneeNikon Corporation
InventorsHiroshi OHKI, Tomoya NODA, Yosuke OKUDAIRA
Life of this patent
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Abstract
An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.
Claims21
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires, among three wave number vectors having a mutually closed relationship, one modulated image under each of two wave number vectors, and acquires at least two modulated images each having the phase being different under the other one wave number vector;
- and
- the calculating unit, in a spatial frequency spectrum of each of at least the four modulated images acquired by the acquiring unit,
- separates a 0th-order modulating component and ±first-order modulating components of the observational light fluxes superimposed on arbitrary three observation points based on twelve observation values regarding the three observation points which are mutually displaced by an amount of the three wave number vectors.
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires one modulated image under each of three wave number vectors having a mutually closed relationship, and acquires one non-modulated image;
- and
- the calculating unit, in a spatial frequency spectrum of each of the three modulated images and the one non-modulated image acquired by the acquiring unit,
- separates a 0th-order modulating component and ±first-order modulating components of the observational light fluxes superimposed on arbitrary three observation points based on twelve observation values regarding the three observation points which are mutually displaced by an amount of the three wave number vectors.
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires four modulated images each having the phase being different by using the fringes simultaneously having three wave number vectors having a mutually closed relationship;
- and
- the calculating unit, in a spatial frequency spectrum of each of the four modulated images acquired by the acquiring unit,
- separates a 0th-order modulating component and ±first-order modulating components of the observational light fluxes superimposed on arbitrary three observation points based on twelve observation values regarding the three observation points which are mutually displaced by an amount of the three wave number vectors.
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires three modulated images each having the wave number vector being the same and the phase being different;
- and
- the calculating unit, in a spatial frequency spectrum of each of the three modulated images acquired by the acquiring unit,
- separates a 0th-order modulating component, ±first-order modulating components, and ±second-order modulating components of the observational light fluxes superimposed on arbitrary two observation points based on six observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires two modulated images each having the phase being different under each of three wave number vectors having a mutually closed relationship, and acquires one non-modulated image;
- and
- the calculating unit, in a spatial frequency spectrum of each of the six modulated images and the one non-modulated image acquired by the acquiring unit:
- separates ±first-order modulating components of the observational light flux superimposed on arbitrary three observation points based on twenty-one observation values regarding the three observation points which are mutually displaced by an amount of the three wave number vectors;
- and
- separates a 0th-order modulating component and ±second-order modulating components of the observational light fluxes superimposed on arbitrary three observation points based on twenty-one observation values regarding the three observation points which are mutually displaced by a doubled amount of the three wave number vectors.
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires four modulated images each having the phase being different under each of three wave number vectors having a mutually closed relationship;
- and
- the calculating unit, in a spatial frequency spectrum of each of the twelve modulated images acquired by the acquiring unit:
- separates ±first-order modulating components of the observational light flux superimposed on arbitrary three observation points based on thirty-six observation values regarding the three observation points which are mutually displaced by an amount of the three wave number vectors;
- and
- separates a 0th-order modulating component and ±second-order modulating components of the observational light fluxes superimposed on arbitrary three observation points based on thirty-six observation values regarding the three observation points which are mutually displaced by a doubled amount of the three wave number vectors.
A structured illuminating microscopy apparatus, comprising:
- an illuminating optical system performing a spatial modulation on a sample by fringes;
- an image-forming optical system performing a modulating image formation of the sample by forming an image of an observational light flux from the sample being performed the spatial modulation;
- an acquiring unit controlling at least one of a wave number vector of the fringes and a phase of the fringes, and capturing a result of the modulating image formation to acquire a modulated image of the sample;
- and
- a calculating unit generating an image of the sample based on the modulated image acquired by the acquiring unit, wherein:
- the acquiring unit
- acquires, among three wave number vectors having a mutually closed relationship, two modulated images each having the phase being different under each of two wave number vectors, and acquires four modulated images each having the phase being different under the other one wave number vector;
- and
- the calculating unit, in a spatial frequency spectrum of each of the eight modulated images acquired by the acquiring unit:
- separates ±first-order modulating components of the observational light flux superimposed on arbitrary three observation points based on twenty-four observation values regarding the three observation points which are mutually displaced by an amount of the three wave number vectors;
- and
- separates a 0th-order modulating component and ±second-order modulating components of the observational light fluxes superimposed on arbitrary three observation points based on twenty-four observation values regarding the three observation points which are mutually displaced by a doubled amount of the three wave number vectors.
Dependencies are inferred from the claim text.