Super-resolution microscope

A super-resolution microscope comprising:

• an illuminator configured to irradiate a plurality of illumination beams of different wavelengths through an objective lens onto a sample while causing at least a portion of the plurality of illumination beams to overlap spatially and temporally;
• and
• a detector configured to detect a signal beam generated by the sample as a result of irradiation of the sample with the plurality of illumination beams;
• wherein
• the plurality of illumination beams comprises a first illumination beam that induces a first nonlinear optical process with respect to the sample and a second illumination beam that induces a second nonlinear optical process that suppresses the first nonlinear optical process;
• and
• a nonlinear susceptibility of the second nonlinear optical process is greater than a nonlinear susceptibility of the first nonlinear optical process.